We present a general technique for measuring the propagation delay on the internal wires of FPGA chips. The measure is based on the comparison between the operating frequencies of two ring oscillators that differ only for the structure under test, that is included (or not) in the loop. Experimental results are presented for a device of the Xilinx XC4000 family.

Direct Measures of Path Delays on Commercial FPGA Chips

BOGLIOLO, ALESSANDRO
2002

Abstract

We present a general technique for measuring the propagation delay on the internal wires of FPGA chips. The measure is based on the comparison between the operating frequencies of two ring oscillators that differ only for the structure under test, that is included (or not) in the loop. Experimental results are presented for a device of the Xilinx XC4000 family.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11576/1891699
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