We present a general technique for measuring the propagation delay on the internal wires of FPGA chips. The measure is based on the comparison between the operating frequencies of two ring oscillators that differ only for the structure under test, that is included (or not) in the loop. Experimental results are presented for a device of the Xilinx XC4000 family.
Direct Measures of Path Delays on Commercial FPGA Chips
BOGLIOLO, ALESSANDRO
2002
Abstract
We present a general technique for measuring the propagation delay on the internal wires of FPGA chips. The measure is based on the comparison between the operating frequencies of two ring oscillators that differ only for the structure under test, that is included (or not) in the loop. Experimental results are presented for a device of the Xilinx XC4000 family.File in questo prodotto:
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