Single Event Upsets (SEU) arising from atmospheric neutrons and alpha particles are becoming increasingly important in combinational logic circuits. Combinational logic is resilient to soft errors due to three masking phenomena: (1) Logical Masking, (2) Electrical Masking, and (3) Latching-window Masking. This paper concentrates on logical masking, and proposes a probabilistic model which calculates the Soft Error Rate (SER) of any output node in combinational logic circuits, based on inherent logical masking properties.

A Probabilistic Model for Soft-Error Rate Estimation in Combinational Logic

LATTANZI E;ALESSANDRO BOGLIOLO
2004

Abstract

Single Event Upsets (SEU) arising from atmospheric neutrons and alpha particles are becoming increasingly important in combinational logic circuits. Combinational logic is resilient to soft errors due to three masking phenomena: (1) Logical Masking, (2) Electrical Masking, and (3) Latching-window Masking. This paper concentrates on logical masking, and proposes a probabilistic model which calculates the Soft Error Rate (SER) of any output node in combinational logic circuits, based on inherent logical masking properties.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11576/1892596
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